Six Sigma tools and statistical techniques are crucial for process improvement. They include basic quality tools like process mapping and cause-effect diagrams, as well as statistical methods such as descriptive statistics and hypothesis testing. These tools help identify issues and analyze data effectively.
Process capability and graphical tools complement Six Sigma methods. Process capability indices assess a process's ability to meet specifications, while graphical tools like histograms and control charts visualize data patterns. Together, these techniques support data-driven decision-making and continuous improvement efforts.
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Process mapping visualizes workflow steps graphically
Flowcharts depict sequence of activities with symbols (rectangles, diamonds)
Value stream maps identify value-adding and non-value-adding activities (material flow, information flow)
SIPOC diagrams outline high-level process view (Suppliers, Inputs, Process, Outputs, Customers)
Cause-effect diagrams illustrate potential causes of problems
Ishikawa diagrams organize causes into categories (Man, Machine, Method, Material)
Fishbone diagrams visually resemble fish skeleton structure
5 Whys analysis uncovers root causes by repeatedly asking "Why?" (equipment failure, human error)
Check sheets collect and organize data systematically (defect types, frequency counts)
Brainstorming techniques generate ideas collaboratively (round-robin, mind mapping)
Statistical techniques for analysis
Descriptive statistics summarize data characteristics
Measures of central tendency locate data center
Mean calculates arithmetic average
Median identifies middle value in ordered dataset
Mode determines most frequent value
Measures of dispersion quantify data spread
Range measures difference between maximum and minimum values
Variance calculates average squared deviation from mean
Standard deviation square root of variance indicates typical deviation from mean
Hypothesis testing evaluates claims about population parameters
Null and alternative hypotheses state competing claims
p-value probability of obtaining results assuming null hypothesis is true
Type I error rejecting true null hypothesis (false positive)
Type II error failing to reject false null hypothesis (false negative)
t-tests compare means of two groups (independent samples, paired samples)
ANOVA compares means of three or more groups (one-way, two-way)
Regression analysis models relationships between variables
Simple linear regression predicts one dependent variable from one independent variable
Multiple regression predicts dependent variable from multiple independent variables
R-squared value measures proportion of variance explained by model
Residual analysis assesses model fit and assumptions (normality, homoscedasticity)
Process capability and indices
Process capability assesses process ability to meet specifications
Natural process limits represent inherent process variation (±3 sigma)
Specification limits define acceptable output range (USL, LSL)
Process capability indices quantify process performance
C p C_p C p measures potential capability assuming process is centered
C p k C_{pk} C p k accounts for process centering relative to specification limits
P p P_p P p similar to C p C_p C p but uses overall process standard deviation
P p k P_{pk} P p k similar to C p k C_{pk} C p k but uses overall process standard deviation
Calculation formulas
C p = U S L − L S L 6 σ C_p = \frac{USL - LSL}{6\sigma} C p = 6 σ U S L − L S L compares specification width to process spread
C p k = min ( U S L − μ 3 σ , μ − L S L 3 σ ) C_{pk} = \min(\frac{USL - \mu}{3\sigma}, \frac{\mu - LSL}{3\sigma}) C p k = min ( 3 σ U S L − μ , 3 σ μ − L S L ) considers process centering
Interpretation of capability indices guides process improvement efforts (>1.33 considered capable)
Histograms display frequency distribution of continuous data
Frequency distribution shows data groupings (bar heights)
Shape of distribution reveals patterns (normal, skewed, bimodal)
Skewness indicates asymmetry (right-skewed, left-skewed)
Pareto charts prioritize improvement efforts
80-20 rule suggests 80% of effects come from 20% of causes
Cumulative percentage line shows running total of categories
Control charts monitor process stability over time
Common cause variation results from inherent process factors
Special cause variation indicates assignable, non-random factors
Upper and lower control limits define expected process variation (±3 sigma)
X-bar and R charts monitor process mean and range for subgroups
Individual and moving range charts used for individual measurements
Scatter plots explore relationships between two variables
Correlation analysis quantifies strength and direction of relationship
Trend identification reveals patterns (linear, curvilinear, clusters)