An atomic force microscope (AFM) is a high-resolution type of scanning probe microscope with a resolution on the order of fractions of a nanometer. It is used to image, measure, and manipulate matter at the nanoscale.
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AFM can generate images at the atomic level without requiring sample staining or coating.
It uses a cantilever with a sharp tip to scan the surface of the specimen.
AFM operates in several modes including contact mode, tapping mode, and non-contact mode.
The deflection of the cantilever is measured using a laser beam reflected off its surface onto a photodetector.
AFM can be used to study both biological specimens like cells and proteins as well as inorganic materials.
Review Questions
What primary component does an atomic force microscope use to scan surfaces?
How does an AFM measure the deflection of its cantilever?
Name at least two types of materials that can be studied using an AFM.
Related terms
Scanning Electron Microscope (SEM): A type of electron microscope that produces images by scanning the surface with a focused beam of electrons.
Scanning Tunneling Microscope (STM): A microscope that uses quantum tunneling to generate high-resolution images of surfaces at the atomic level.
Confocal Laser Scanning Microscope (CLSM): A fluorescence imaging technique that increases optical resolution and contrast by using point illumination and spatial pinhole detection.