Apertureless near-field microscopy is a high-resolution imaging technique that utilizes a sharp metallic tip to scan the surface of a sample without the need for a traditional aperture. This method allows for the collection of terahertz radiation at subwavelength resolution, providing detailed information about the sample's material properties and structures. By taking advantage of near-field effects, this technique enhances resolution beyond the diffraction limit commonly seen in conventional imaging methods.
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