Scanning probe lithography takes nanofabrication to the atomic level. Using tools like atomic force microscopes, we can manipulate individual atoms and molecules to create incredibly tiny structures. It's like painting with the smallest brush imaginable.
This technique opens up new possibilities for making super-small electronic devices and sensors. By precisely placing atoms and molecules, we can build things that were impossible before. It's slow but allows for incredible precision and control.
Scanning Probe Microscopy Techniques
Atomic Force and Scanning Tunneling Microscopes
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Atomic force microscope (AFM) utilizes a sharp tip attached to a cantilever to scan sample surfaces
Measures forces between tip and sample using laser deflection off cantilever
Operates in contact, non-contact, and tapping modes for various applications
Scanning tunneling microscope (STM) employs a conducting tip to measure tunneling current
Requires conductive samples for imaging
Provides atomic-scale resolution of surface topography and electronic structure
Both AFM and STM offer high-resolution imaging capabilities (atomic scale)
AFM resolution typically 1-10 nm laterally, <1 nm vertically
STM resolution can reach 0.1 nm laterally, 0.01 nm vertically
Scanning probe techniques enable surface manipulation at nanoscale
Move individual atoms (STM)
Modify surface chemistry (AFM)
Applications and Limitations
AFM applications include surface characterization, force measurements, and nanomanipulation
Used in materials science, biology, and semiconductor industries
STM primarily used for conductive materials and surface science studies
Provides insights into electronic properties and atomic arrangements
Resolution limited by tip sharpness, environmental factors, and sample properties
Thermal drift and vibrations can affect image quality
Tip convolution effects may distort features smaller than tip radius