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11.2 X-ray absorption and fluorescence spectroscopy

3 min readaugust 9, 2024

X-ray absorption and fluorescence spectroscopy are powerful techniques for probing atomic structure and composition. These methods use X-rays to excite electrons in atoms, revealing information about oxidation states, coordination environments, and elemental makeup.

and analyze absorption spectra, while XRF detects emitted X-rays. These techniques find applications in materials science, environmental studies, and archaeology. They provide valuable insights into local atomic structures and elemental compositions of various samples.

X-ray Absorption Spectroscopy

XANES and EXAFS Techniques

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Top images from around the web for XANES and EXAFS Techniques
  • (XANES) analyzes the absorption spectrum near the
  • XANES provides information about the oxidation state and coordination environment of the absorbing atom
  • (EXAFS) examines the oscillations in the absorption spectrum beyond the absorption edge
  • EXAFS yields data on the local atomic structure, including bond distances and coordination numbers

Absorption Edge and Synchrotron Radiation

  • Absorption edge occurs when incident X-ray energy matches the binding energy of a core electron
  • Edge energy depends on the element and its oxidation state
  • K-edge involves 1s electrons, while L-edge involves 2s and 2p electrons
  • produces high-intensity, tunable X-rays for absorption experiments
  • Synchrotron facilities generate radiation by accelerating electrons in a circular path

Applications and Data Analysis

  • XANES applications include studying catalysts, environmental samples, and materials science
  • EXAFS used in determining local structure of amorphous materials and dilute systems
  • Data analysis involves background subtraction, normalization, and Fourier transformation
  • Theoretical modeling compares experimental data with simulated spectra for structural determination

X-ray Fluorescence Spectroscopy

Principles and Instrumentation

  • X-ray fluorescence (XRF) detects characteristic X-rays emitted by atoms after excitation
  • Primary X-rays excite inner-shell electrons, creating vacancies filled by outer-shell electrons
  • Energy difference between shells released as fluorescent X-rays
  • XRF spectrometers consist of X-ray source, sample holder, and

Energy-dispersive and Wavelength-dispersive XRF

  • () uses a solid-state detector to measure X-ray energies directly
  • EDXRF offers rapid, simultaneous multi-element analysis
  • () employs a crystal to diffract X-rays before detection
  • WDXRF provides higher and lower detection limits than EDXRF

Applications and Sample Preparation

  • XRF used for elemental analysis in geology, archaeology, and materials science
  • Non-destructive technique suitable for analyzing solids, liquids, and powders
  • Sample preparation methods include pressed pellets, fused beads, and thin films
  • requires matrix correction and calibration with standards

Electron Spectroscopy

X-ray Photoelectron Spectroscopy (XPS)

  • XPS analyzes the kinetic energy of photoelectrons ejected by X-ray irradiation
  • Binding energy calculated from the difference between X-ray energy and photoelectron kinetic energy
  • Chemical shifts in binding energies reveal information about chemical environment and oxidation state
  • XPS provides surface-sensitive analysis (top 1-10 nm of the sample)

Auger Electron Spectroscopy and Instrumentation

  • Auger electron spectroscopy detects electrons emitted during the Auger process
  • Auger process involves filling an inner-shell vacancy and ejecting a second electron
  • Auger electrons have element-specific kinetic energies independent of the excitation source
  • Instrumentation includes ultra-high vacuum chamber, electron gun, and electron energy analyzer

Applications and Data Interpretation

  • XPS applications include surface analysis, thin film characterization, and corrosion studies
  • Auger electron spectroscopy used for elemental mapping and depth profiling
  • Data interpretation involves peak identification, background subtraction, and quantification
  • Spectral features include main peaks, shake-up satellites, and multiplet splitting
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© 2024 Fiveable Inc. All rights reserved.
AP® and SAT® are trademarks registered by the College Board, which is not affiliated with, and does not endorse this website.

© 2024 Fiveable Inc. All rights reserved.
AP® and SAT® are trademarks registered by the College Board, which is not affiliated with, and does not endorse this website.
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